TestWay Express is a world-wide reference coverage analysis tool that allows users to quantify and qualify the test coverage for a wide range of inspection and test equipment. It has been enhanced to address the problem for companies that subcontract the manufacture and test of their products, but need to know how to optimize the physical test access, in order to achieve maximum test coverage.
TestWay Express is a fully integrated solution that enables electronic manufacturers to optimize the design to test flow:
-Define the manufacturing line; including a combination of assembly, inspection and test machines.
-Estimate the test coverage of each individual stage and optimize the combined results.
-Generate the input files for each test stage that reflect the selected strategy.
-Measure the real test coverage by importing the post-debug test program or coverage data.
-Compare the early estimation with the actual measured test program coverage, identifying gaps in the overall strategy.
Test is essential for improving product quality by striving to detect and prevent all faults on a product. This maximizes the number of good products shipped to the customer. It is important to:
-Define the optimum test strategy to maximize the test coverage.
-Produce a test specification document that defines what to test.
-Compare the developed tests against the test requirements.
-Understand the production process capability and determine an acceptable level of defects that can be shipped to the customer.
TestWay Express analyzes the number of defects detected at each stage in the test process and identifies any shortfall in test coverage and undetected defects. It allows the computation of the IPC metrics such as first pass yield (FPY), fall-of-rate or escape rate by importing the real time DPMO (Defect Per Million Opportunities) from the manufacturing process. The manufacturing test strategy is tuned to provide the optimal test coverage for identifying potential defects.
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